39th International Conference on Microelectronic Test Structures (ICMTS)

The Conference will bring together designers and users of test structures to discuss recent developments and future directions, in a one-track program, with convivial breaks allowing attendees to discuss and exchange viewpoints and challenges.

A Tutorial Short Course will precede the Technical Conference. Several of the best measurement, equipment, design, and manufacturing experts, will participate to the company/equipment exhibition.

A Best Paper award will be presented by the Technical Program Committee. The conference is co-sponsored by the IEEE Electron Devices Society and all the presented papers will be submitted for possible inclusion on IEEE Xplore® Library.

For further information please check the 39th ICMTS Call for paper (deadline November 1st, 2026)

http://www.icmts.net